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Eshwar Ram Arunachaleswaran
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Fair and efficient cake division with connected pieces
ER Arunachaleswaran, S Barman, R Kumar, N Rathi
International Conference on Web and Internet Economics, 57-70, 2019
292019
Fully polynomial-time approximation schemes for fair rent division
ER Arunachaleswaran, S Barman, N Rathi
Mathematics of Operations Research 47 (3), 1970-1998, 2022
92022
Pipeline interventions
ER Arunachaleswaran, S Kannan, A Roth, J Ziani
Mathematics of Operations Research 47 (4), 3207-3238, 2022
82022
Efficient stackelberg strategies for finitely repeated games
N Collina, ER Arunachaleswaran, M Kearns
Proceedings of the 2023 International Conference on Autonomous Agents and …, 2023
52023
Fair division with a secretive agent
ER Arunachaleswaran, S Barman, N Rathi
Proceedings of the AAAI Conference on Artificial Intelligence 33 (01), 1732-1739, 2019
52019
Wealth dynamics over generations: Analysis and interventions
K Acharya, ER Arunachaleswaran, S Kannan, A Roth, J Ziani
2023 IEEE Conference on Secure and Trustworthy Machine Learning (SaTML), 42-57, 2023
32023
The price of indivisibility in cake cutting
ER Arunachaleswaran, R Gopalakrishnan
arXiv preprint arXiv:1801.08341, 2018
32018
Pareto-Optimal Algorithms for Learning in Games
ER Arunachaleswaran, N Collina, J Schneider
arXiv preprint arXiv:2402.09549, 2024
12024
Efficient Stackelberg Strategies for Finitely Repeated Games
ER Arunachaleswaran, N Collina, M Kearns
arXiv preprint arXiv:2207.04192, 2022
12022
An Elementary Predictor Obtaining Distance to Calibration
ER Arunachaleswaran, N Collina, A Roth, M Shi
arXiv preprint arXiv:2402.11410, 2024
2024
Oracle Efficient Algorithms for Groupwise Regret
K Acharya, ER Arunachaleswaran, S Kannan, A Roth, J Ziani
arXiv preprint arXiv:2310.04652, 2023
2023
Reconstructing Ultrametric Trees from Noisy Experiments
ER Arunachaleswaran, A De, S Kannan
International Conference on Algorithmic Learning Theory, 82-114, 2023
2023
2023 IEEE Conference on Secure and Trustworthy Machine Learning (SaTML)| 978-1-6654-6299-0/23/$31.00© 2023 IEEE| DOI: 10.1109/SATML54575. 2023.00051
G Abad, K Acharya, H Aghakhani, U Aïvodji, P Altmeyer, HS Anderson, ...
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