| Investigation and review of the thermal, mechanical, electrical, optical, and structural properties of atomic layer deposited high-k dielectrics: Beryllium oxide, aluminum … JT Gaskins, PE Hopkins, DR Merrill, SR Bauers, E Hadland, DC Johnson, ... ECS Journal of Solid State Science and Technology 6 (10), N189, 2017 | 108 | 2017 |
| Tuning the properties of a complex disordered material: Full factorial investigation of PECVD-grown amorphous hydrogenated boron carbide BJ Nordell, CL Keck, TD Nguyen, AN Caruso, SS Purohit, WA Lanford, ... Materials Chemistry and Physics 173, 268-284, 2016 | 34 | 2016 |
| Investigation of atomic layer deposited beryllium oxide material properties for high-k dielectric applications D Koh, JH Yum, SK Banerjee, TW Hudnall, C Bielawski, WA Lanford, ... Journal of Vacuum Science & Technology B, Nanotechnology and …, 2014 | 29 | 2014 |
| Conquering the Low‐k Death Curve: Insulating Boron Carbide Dielectrics with Superior Mechanical Properties BJ Nordell, TD Nguyen, CL Keck, S Dhungana, AN Caruso, WA Lanford, ... Advanced Electronic Materials 2 (7), 1600073, 2016 | 26 | 2016 |
| Carbon‐Enriched Amorphous Hydrogenated Boron Carbide Films for Very‐Low‐k Interlayer Dielectrics BJ Nordell, TD Nguyen, AN Caruso, SS Purohit, NA Oyler, WA Lanford, ... Advanced Electronic Materials 3 (12), 1700116, 2017 | 20 | 2017 |
| Investigation of the dielectric and mechanical properties for magnetron sputtered BCN thin films A Prakash, V Todi, KB Sundaram, L Ross, G Xu, M French, P Henry, ... ECS Journal of Solid State Science and Technology 4 (1), N3122, 2014 | 20 | 2014 |
| Network structure of a-SiO: H layers fabricated by plasma-enhanced chemical vapor deposition: Comparison with a-SiC: H layers M Sato, SW King, WA Lanford, P Henry, T Fujiseki, H Fujiwara Journal of Non-Crystalline Solids 440, 49-58, 2016 | 13 | 2016 |
| Topological Constraint Theory Analysis of Rigidity Transition in Highly Coordinate Amorphous Hydrogenated Boron Carbide BJ Nordell, TD Nguyen, AN Caruso, WA Lanford, P Henry, H Li, LL Ross, ... Frontiers in Materials 6, 264, 2019 | 5 | 2019 |
| Enhanced Adhesion of Au Films by Electrodeposition onto Porous Si J Zhu, P Henry, ML Weaver, ML Reed, G Zangari Journal of The Electrochemical Society 160 (11), D507, 2013 | 3 | 2013 |
| Erratum: Review—Investigation and Review of the Thermal, Mechanical, Electrical, Optical, and Structural Properties of Atomic Layer Deposited High-k Dielectrics: Beryllium … JT Gaskins, PE Hopkins, DR Merrill, SR Bauers, E Hadland, DC Johnson, ... ECS Journal of Solid State Science and Technology 7 (5), X3, 2018 | 1 | 2018 |
| Erratum: Review—Investigation and Review of the Thermal, Mechanical, Electrical, Optical, and Structural Properties of Atomic Layer Deposited High-k Dielectrics: Beryllium … JT Gaskins, PE Hopkins, DR Merrill, SR Bauers, E Hadland, DC Johnson, ... ECS Journal of Solid State Science and Technology 7 (5), X3, 2018 | 1 | 2018 |
| Topological Constraint Theory Analysis of Rigidity Transition in Highly Coordinate Amorphous Hydrogenated Boron Carbide WA Lanford, BJ Nordell, TD Nguyen, AN Caruso, P Henry, H Li, LL Ross, ... | | 2019 |
| Investigation and Review of the Thermal, Mechanical, Electrical, Optical, and Structural Properties of Atomic Layer Deposited High-k Dielectrics: Beryllium Oxide, Aluminum … JT Gaskins, PE Hopkins, DR Merrill, SR Bauers, E Hadland, DC Johnson, ... ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY 7 (5), X3-X3, 2018 | | 2018 |
| Influence of polymeric underlayers on physical vapor deposited titanium and titanium nitride thin films PJ Henry The University of Alabama, 2008 | | 2008 |
