| Effect of electrical stress on Au/Pb (Zr0. 52Ti0. 48) O3/TiOxNy/Si gate stack for reliability analysis of ferroelectric field effect transistors R Khosla, DK Sharma, K Mondal, SK Sharma Applied Physics Letters 105 (15), 2014 | 19 | 2014 |
| Multilevel metal/Pb (Zr0. 52Ti0. 48) O3/TiOxNy/Si for next generation FeRAM technology node DK Sharma, R Khosla, SK Sharma Solid-State Electronics 111, 42-46, 2015 | 15 | 2015 |
| Instrument for Lunar Seismic Activity Studies on Chandrayaan-2 Lander J John, V Thamarai, MM Mehra, T Choudhary, MS Giridhar, ... Current Science 118 (3), 376-382, 2020 | 6 | 2020 |
| Oxide Edge Trap Density Extraction in Silicon Nanowire MOSFET from Tunnel Current Noise Measurement in Gated Diode like Arrangement AD D. K. Sharma IEEE Transactions on Device and Materials Reliability, 2020 | 2 | 2020 |
| Rate limited filament formation in Al-ZnO-Al bipolar ReRAM cells and its impact on early current window closure during cycling AD Amit Kumar Singh Chauhan, Deepak K. Sharma Journal of Applied Physics 125, 104503, 2019 | 2 | 2019 |
| Design and fabrication process development of MEMS quadrupole mass filter for space applications A Balakrishnan, G Supriya, DK Sharma, A Jambhalikar, MS Giridhar, ... ISSS Journal of Micro and Smart Systems 12 (1), 33-42, 2023 | 1 | 2023 |
| Testing and Qualification of RF MEMS Switch Demonstrator Payload (RFMEMS-TD1) for Small Satellite Platform MS Giridhar, TK Pratheek, S Biswas, MM Nandakishor, A Jambhalikar, ... Advances in Small Satellite Technologies: Proceedings of National Conference …, 2023 | 1 | 2023 |
| Design and development of broadband DC-10 GHz packaged RF MEMS switches with on chip CPW-microstrip transitions S Singh, MS Giridhar, A Jambhalikar, TK Pratheek, Akshaya, ... Sādhanā 47 (2), 65, 2022 | 1 | 2022 |
| Field Stress Influenced Conduction Behavior of Narrow Diameter Gate-All-Around (GAA) Silicon Nanowire n-MOSFET DK Sharma, RK Goud, A Datta, S Manhas Journal of Electronic Materials 48, 7674-7679, 2019 | 1 | 2019 |
| Impact of Varying Strain Energy in Oxide on Random Telegraph Noise and Associated Time Constants in Silicon Nanowire pMOSFETs DK Sharma, A Datta IEEE Transactions on Electron Devices 66 (3), 1489 - 1494, 2019 | 1 | 2019 |
| High performance Au/PZT/TiOxNy/Si MFIS structure for next generation ferroelectric memory applications DK Sharma, R Khosla, SK Sharma AIP Conference Proceedings 1661 (1), 2015 | 1 | 2015 |
| Impact of heavy ions on a-Si: H/PolySi bilayer thin film transistors with Schottky barrier source and drain based on Nickel Silicide DK Sharma, V Kumar Memories-Materials, Devices, Circuits and Systems 7, 100096, 2024 | | 2024 |
| Capacitance modelling of MEMS quadrupole mass filter S Ashwath, B Anitha, DK Sharma, A Jambhalikar, G Supriya, J John AIP Conference Proceedings 2995 (1), 2024 | | 2024 |
| TCAD-Based Analysis of Nanosheet and Forksheet FET Electrical Characteristics in the Presence of Gamma and Heavy Ion Radiation N Anand, R Rai, Y Verma, AKS Chauhan, DK Sharma, V Kumar 2023 11th International Symposium on Electronic Systems Devices and …, 2023 | | 2023 |
| Process Development for Very Deep Etching of Silicon Using Two Layer Masks for Fabrication of Mechanically Decoupled MEMS Gyroscope DK Sharma, J John, G Supriya, A Jambhalikar, MS Giridhar 2021 25th International Symposium on VLSI Design and Test (VDAT), 2021 | | 2021 |
| Computational study on ion dynamics of MEMS quadrupole mass filter B Anitha, S Gogulapati, DK Sharma, J John, MS Giridhar, A Jambhalikar Manufacturing Technology Today 19 (10), 20-26, 2020 | | 2020 |
| Computational Study on Ion dynamics of MEMS Quadrupole Mass Filter AJ Anitha. B., Supriya Gogulapati, Deepak Kumar Sharma, John. J., Giridhar ... NCMST 2020, 2020 | | 2020 |
| EXPERIMENTAL INVESTIGATION OF MEMS BASED MICRO HEAT PIPE WITH INFRA RED CAMERA JKB Hriday Datha, Ashwini Jambhalikar,Shubajit Biswas, J. John, M. S ... ISSS 2019, 2019 | | 2019 |
| Reliability evaluation of erbium oxide thin films as a gate dielectric for CMOS technology DKSSKS Robin Khosla* Proceedings of the International Conference On: Multifunctional Materials …, 2014 | | 2014 |
