C. H. Joseph
C. H. Joseph
Researcher, Department of Information Engineering, UniversitÓ Politecnica delle Marche, Ancona
Verified email at staff.univpm.it - Homepage
Title
Cited by
Cited by
Year
Scanning microwave microscopy technique for nanoscale characterization of magnetic materials
CH Joseph, GM Sardi, SS Tuca, G Gramse, A Lucibello, E Proietti, ...
Journal of Magnetism and Magnetic Materials 420, 62-69, 2016
92016
De-embedding techniques for nanoscale characterization of semiconductors by scanning microwave microscopy
L Michalas, E Brinciotti, A Lucibello, G Gramse, CH Joseph, F Kienberger, ...
Microelectronic Engineering 159, 64-69, 2016
52016
Scanning microwave microscopy for nanoscale characterization of semiconductors: De-embedding reflection contact mode measurements
L Michalas, A Lucibello, G Badino, CH Joseph, E Brinciotti, F Kienberger, ...
2015 European Microwave Conference (EuMC), 159-162, 2015
52015
Transmission microwave spectroscopy for local characterization of dielectric materials
A Lucibello, CH Joseph, E Proietti, GM Sardi, G Capoccia, R Marcelli
Journal of Vacuum Science & Technology B, Nanotechnology andá…, 2017
32017
Inverted Scanning Microwave Microscopy for Nanometer-scale Imaging and Characterization of Platinum Diselenide
G Fabi, X Jin, JCM Hwang, CH Joseph, E Pavoni, L Li, K Xiong, Y Ning, ...
2019 IEEE MTT-S International Microwave Symposium (IMS), 1115-1117, 2019
22019
Nanoscale characterization of MOS systems by microwaves: Dopant profiling calibration
L Michalas, A Lucibello, CH Joseph, E Brinciotti, F Kienberger, E Proietti, ...
EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop andá…, 2015
22015
Electrical properties of Jurkat cells: An inverted scanning microwave microscope study
G Fabi, CH Joseph, X Jin, X Wang, T Pietrangelo, X Cheng, JCM Hwang, ...
2020 IEEE/MTT-S International Microwave Symposium (IMS), 237-240, 2020
12020
Blisters on graphite surface: a scanning microwave microscopy investigation
E Pavoni, R Yivlialin, CH Joseph, G Fabi, D Mencarelli, L Pierantoni, ...
RSC advances 9 (40), 23156-23160, 2019
12019
Near-field microwave techniques for micro-and nano-scale characterization in materials science
R Marcelli, A Lucibello, G Capoccia, E Proietti, GM Sardi, HJ Christopher, ...
2017 International Semiconductor Conference (CAS), 29-36, 2017
12017
Novel Phase Based Feedback Control for Constant Height Mode Operation in Scanning Near-Field Microwave Microscopy
CH JOSEPH, V SUBRAMANIAN
Electromagnetic Nondestructive Evaluation XXII 44, 20, 2019
2019
Transmission Microwave Spectroscopy of Dielectric Materials
A Lucibello, E Proietti, GM Sardi, G Capoccia, CH Joseph, R Marcelli
Microwave Characterization of Magnetic Materials Using Scanning Microwave Microscopy Technique
CH Joseph, G Badino, SS Tuca, GM Sardi, F Kienberger, R Marcelli
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Articles 1–12