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Dr. Ankit Bansal, SMIEEE, LMISTE
Dr. Ankit Bansal, SMIEEE, LMISTE
Chitkara University Institute of Engineering and Technology, Chitkara University, Punjab
Verified email at chitkara.edu.in - Homepage
Title
Cited by
Cited by
Year
Recognizing Wheat Aphid Disease Using a Novel Parallel Real-Time Technique Based on Mask Scoring RCNN
V Kukreja, D Kumar, A Bansal, V Solanki
2022 2nd International Conference on Advance Computing and Innovative …, 2022
382022
Using Identity-Based Cryptography as a Foundation for an Effective and Secure Cloud Model for E-Health
S Mittal, A Bansal, D Gupta, S Juneja, H Turabieh, MM Elarabawy, ...
Computational Intelligence and Neuroscience 2022, 2022
372022
Efficient Bag of Deep Visual Words Based features to classify CRC Images for Colorectal Tumor Diagnosis
K Saluja, A Bansal, A Vajpaye, S Gupta, A Anand
2022 2nd International Conference on Advance Computing and Innovative …, 2022
342022
Rice Leaf blight Disease detection using multi-classification deep learning model
R Sharma, V Kukreja, RK Kaushal, A Bansal, A Kaur
2022 10th International Conference on Reliability, Infocom Technologies and …, 2022
332022
Exploring the Potential of Convolutional Neural Networks in Automatic Diagnosis of Dragon Fruit Diseases from Plant Photographs
S Mehta, V Kukreja, A Bansal, K Kaur, A Singh
2023 7th International Conference on Intelligent Computing and Control …, 2023
322023
Deep Learning Based Multi-Classification Model for Rice Disease Detection
P Singla, Niharika, R jain, R Sharma, V Kukreja, A Bansal
2022 10th International Conference on Reliability, Infocom Technologies and …, 2022
322022
IOT Big Data Analytics in Healthcare: Benefits and Challenges
AB Kushwant Kaur, Sahil Verma
6th International Conference on Signal Processing, Computing and Control …, 2021
292021
HIS integration systems using modality worklist and DICOM
KS Mann, A Bansal
Procedia Computer Science 37, 16-23, 2014
182014
Integration of blockchain and IoT for data storage and management
VA Athavale, A Bansal, S Nalajala, S Aurelia
Materials Today: Proceedings, 2020
162020
Multi classification of Tomato Leaf Diseases: A Convolutional Neural Network Model
A Sharma, V Kukreja, A Bansal, M Mahajan
2022 10th International Conference on Reliability, Infocom Technologies and …, 2022
122022
Blockchain technology: Applied to big data in collaborative edges
K Saluja, S Gupta, A Vajpayee, SK Debnath, A Bansal, N Sharma
Measurement: Sensors 24, 100521, 2022
102022
Big Data and Analytics in Higher Educational Institutions
A Bansal, VA Athavale
Mobile Radio Communications and 5G Networks, 201-208, 2020
72020
Detecting Severity Levels of Cucumber Leaf Spot Disease using ResNext Deep Learning Model: A Digital Image Analysis Approach
A Bansal, R Sharma, V Sharma, AK Jain, V Kukreja
2023 4th International Conference for Emerging Technology (INCET), 1-6, 2023
62023
Multiclassification of Seven citrus fruits diseases using the Deep Learning Approach
Y Nagpal, V Jindal, V Kukreja, A Bansal, A Singh
2022 10th International Conference on Reliability, Infocom Technologies and …, 2022
42022
Problems with the implementation of blockchain technology for decentralized IoT authentication: A literature review
VA Athavale, A Bansal
Blockchain for Industry 4.0, 91-119, 2022
42022
A case study on the classification of brain tumour by deep learning using convolutional neural network
S Gupta, R Saxena, A Bansal, K Saluja, A Vajpayee, S Shikha
AIP Conference Proceedings 2782 (1), 2023
32023
Applying Neural Imaging and ML to OCD Severity Prediction
M Sachdeva, HK Sharma, A Kumar, A Bansal, K Saluja
2022 Seventh International Conference on Parallel, Distributed and Grid …, 2022
32022
Security of Data of EHR in a grid computing Environment
KS Mann, A Bansal
International Journal of Computer Applications 975, 8887, 2010
32010
Cyber-Physical Systems for Smart City Applications: A Comparative Study
KD Singh, P Singh, R Chhabra, G Kaur, A Bansal, V Tripathi
2023 International Conference on Advancement in Computation & Computer …, 2023
22023
A Deep Learning Approach to Detect and Classify Wheat Leaf Spot Using Faster R-CNN and Support Vector Machine
A Bansal, R Sharma, V Sharma, AK Jain, V Kukreja
2023 IEEE 8th International Conference for Convergence in Technology (I2CT), 1-6, 2023
22023
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