| High-temperature measurement of Seebeck coefficient and electrical conductivity J De Boor, C Stiewe, P Ziolkowski, T Dasgupta, G Karpinski, E Lenz, ... Journal of electronic materials 42 (7), 1711-1718, 2013 | 116 | 2013 |
| Relativistic laser-field-drift suppression of nonsequential multiple ionization M Dammasch, M Dörr, U Eichmann, E Lenz, W Sandner Physical Review A 64 (6), 061402, 2001 | 103 | 2001 |
| Atomic structure and optical properties of InAs submonolayer depositions in GaAs A Lenz, H Eisele, J Becker, JH Schulze, TD Germann, F Luckert, ... Journal of Vacuum Science & Technology B, Nanotechnology and …, 2011 | 53 | 2011 |
| Atomic Structure of Buried InAs Sub-Monolayer Depositions in GaAs A Lenz, H Eisele, J Becker, L Ivanova, E Lenz, F Luckert, K Pötschke, ... Applied physics express 3 (10), 105602, 2010 | 38 | 2010 |
| Contrast mechanisms in cross-sectional scanning tunneling microscopy of GaSb/GaAs type-II nanostructures R Timm, RM Feenstra, H Eisele, A Lenz, L Ivanova, E Lenz, M Dähne Journal of Applied Physics 105 (9), 093718, 2009 | 16 | 2009 |
| Traceable Thermoelectric Measurements of Seebeck Coefficients in the Temperature Range from 300 K to 900 K E Lenz, F Edler, P Ziolkowski International Journal of Thermophysics -- DOI 10.1007/s10765-013-1516-x 34 …, 2013 | 12 | 2013 |
| Traceable measurements of electrical conductivity and Seebeck coefficient of β‐Fe0. 95Co0. 05Si2 and Ge in the temperature range from 300 K to 850 K E Lenz, S Haupt, F Edler, P Ziolkowski, HF Pernau physica status solidi (c)--DOI: 10.1002/pssc.201200305 9 (12), 2432-2435, 2012 | 12 | 2012 |
| Interface of GaP/Si (001) and antiphase boundary facet-type determination A Lenz, O Supplie, E Lenz, P Kleinschmidt, T Hannappel Journal of Applied Physics 125 (4), 045304, 2019 | 9 | 2019 |
| Reference Material for Seebeck Coefficients F Edler, E Lenz, S Haupt International Journal of Thermophysics 36, 482, DOI:/10.1007/s10765-014-1761-7, 2014 | 9 | 2014 |
| Metrology for energy harvesting F Edler, E Lenz 9TH EUROPEAN CONFERENCE ON THERMOELECTRICS: ECT2011 -- http://dx.doi.org/10 …, 2012 | 7 | 2012 |
| Homogenization of metamaterials due to fractaloid structures in the microwave regime E Lenz, H Henke Journal of Optics A: Pure and Applied Optics--http://dx.doi.org/10.1088/1464 …, 2009 | 5 | 2009 |
| Relativistic ionization by an ultrastrong and ultraintense laser pulse E Lenz, M Dörr, W Sandner Laser physics 11 (2), 216-220, 2001 | 4 | 2001 |
| Thermoelectric Metrology Standardisation JD König, A Jacquot, HF Pernau, K Tarantik, J Heuer, P Ziolkowski, ... 32nd International Conference on Thermoelectrics, June 30, 2013 | 2 | 2013 |
| A Picturebook Of Relativistically Driven Wavepackets E Lenz, M Dorr, W Sandner Super-Intense Laser-Atom Physics 12, 355, 2001 | 1 | 2001 |
| Determination of the Thermal Conductivity Based on a Thermal Capacitor Model S Haupt, E Lenz, F Edler Materials Today: Proceedings---doi:10.1016/j.matpr.2015.05.108 2 (2), 729-736, 2015 | | 2015 |
| Standardisation of Thermoelectric Material Characterization JD König, A Jacquot, HF Pernau, K Tarantik, J Heuer, M Jägle, ... | | 2013 |
| Messplatz zur Bestimmung absoluter Seebeck-Koeffizienten SHFE E. Lenz Tagungsband - Temperatur 2013, 129, ISBN: 3-9810021-8-0, 2013 | | 2013 |
| Traceable measurements of electrical conductivity and Seebeck coefficient of {beta}-Fe {sub 0.95} Co {sub 0.05} Si {sub 2} and Ge in the temperature range from 300 K to 850 K E Lenz, S Haupt, F Edler, P Ziolkowski, HF Pernau Physica Status Solidi C (online) 9, 2012 | | 2012 |
| Reference materials for traceable measurements of thermoelectric properties from 300 K to 900 K E Lenz, F Edler, P Ziolkowski | | 2012 |
| Reference Materials for Traceable Measurements of the Seebeck Coefficient up to 860 K E Lenz, S Haupt, F Edler Proc. Ser. No 1449, 369, 2012 | | 2012 |
Andrea LenzInstitut für Festkörperphysik, Technische Universität BerlinVerified email at physik.tu-berlin.de
