| First-principles study of the structural, electronic, vibrational, and elastic properties of orthorhombic NiSi D Connétable, O Thomas Physical review B 79 (9), 094101, 2009 | 213 | 2009 |
| Interplay between anisotropic strain relaxation and uniaxial interface magnetic anisotropy in epitaxial Fe films on (001) GaAs O Thomas, Q Shen, P Schieffer, N Tournerie, B Lépine Physical Review Letters 90 (1), 017205, 2003 | 156 | 2003 |
| Molybdenum disilicide: Crystal growth, thermal expansion and resistivity O Thomas, JP Senateur, R Madar, O Laborde, E Rosencher Solid state communications 55 (7), 629-632, 1985 | 128 | 1985 |
| Electrical and optical properties of silicide single crystals and thin films F Nava, KN Tu, O Thomas, JP Senateur, R Madar, A Borghesi, G Guizzetti, ... Materials science reports 9 (4-5), 141-200, 1993 | 123 | 1993 |
| Effect of Co, Pt, and Au additions on the stability and epitaxy of films on (111)Si D Mangelinck, P Gas, JM Gay, B Pichaud, O Thomas Journal of applied physics 84 (5), 2583-2590, 1998 | 98 | 1998 |
| The diffusion of elements implanted in films of cobalt disilicide O Thomas, P Gas, A Charai, FK LeGoues, A Michel, G Scilla, FM d’Heurle Journal of applied physics 64 (6), 2973-2980, 1988 | 75 | 1988 |
| Inversion domain boundaries in GaN wires revealed by coherent Bragg imaging S Labat, MI Richard, M Dupraz, M Gailhanou, G Beutier, M Verdier, ... ACS nano 9 (9), 9210-9216, 2015 | 74 | 2015 |
| Inversion domain boundaries in GaN wires revealed by coherent Bragg imaging S Labat, MI Richard, M Dupraz, M Gailhanou, G Beutier, M Verdier, ... ACS nano 9 (9), 9210-9216, 2015 | 74 | 2015 |
| Some titanium germanium and silicon compounds: Reaction and properties O Thomas, FM d'Heurle, S Delage Journal of Materials Research 5 (7), 1453-1462, 1990 | 74 | 1990 |
| Reaction of titanium with germanium and silicon‐germanium alloys O Thomas, S Delage, FM d’Heurle, G Scilla Applied physics letters 54 (3), 228-230, 1989 | 74 | 1989 |
| Inversion of the diffraction pattern from an inhomogeneously strained crystal using an iterative algorithm AA Minkevich, M Gailhanou, JS Micha, B Charlet, V Chamard, O Thomas Physical Review B 76 (10), 104106, 2007 | 64 | 2007 |
| Metallurgical reinvestigation of rare earth silicides E Houssay, A Rouault, O Thomas, R Madar, JP Senateur Applied Surface Science 38 (1-4), 156-161, 1989 | 64 | 1989 |
| Interdependence of elastic strain and segregation in metallic multilayers: An X-Ray diffraction study of (111) Au/Ni multilayers S Labat, P Gergaud, O Thomas, B Gilles, A Marty Journal of Applied Physics 87 (3), 1172-1181, 2000 | 62 | 2000 |
| First-principles study of nickel-silicides ordered phases D Connétable, O Thomas Journal of Alloys and Compounds 509 (6), 2639-2644, 2011 | 60 | 2011 |
| Fast and easy interpretation of a set of absorption spectra: theory and qualitative applications for UV examination of waters and wastewaters S Gallot, O Thomas Fresenius' journal of analytical chemistry 346, 976-983, 1993 | 60 | 1993 |
| Limits of validity of the crystallite group method in stress determination of thin film structures P Gergaud, S Labat, O Thomas Thin Solid Films 319 (1-2), 9-15, 1998 | 58 | 1998 |
| Dislocation storage in single slip-oriented Cu micro-tensile samples: new insights via X-ray microdiffraction C Kirchlechner, D Kiener, C Motz, S Labat, N Vaxelaire, O Perroud, ... Philosophical Magazine 91 (7-9), 1256-1264, 2011 | 55 | 2011 |
| Formation of Ni silicide from Ni (Au) films on (111) Si D Mangelinck, P Gas, A Grob, B Pichaud, O Thomas Journal of applied physics 79 (8), 4078-4086, 1996 | 55 | 1996 |
| Combined synchrotron X-ray diffraction and wafer curvature measurements during Ni–Si reactive film formation C Rivero, P Gergaud, M Gailhanou, O Thomas, B Froment, H Jaouen, ... Applied Physics Letters 87 (4), 041904, 2005 | 54 | 2005 |
| Ultraviolet multiwavelength absorptiometry (UVMA) for the examination of natural waters and wastewaters: Part I: General considerations O Thomas, S Gallot Fresenius' Journal of Analytical Chemistry 338, 234-237, 1990 | 54 | 1990 |
François WeissCNRS, Grenoble INPVerified email at grenoble-inp.fr
