Characterization and Modeling of IV, CV and Trapping behavior of SiC Power MOSFETs MS Nazir, A Pampori, YH Zarkob, A Kar, YS Chauhan 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023 | 1 | 2023 |
Recent Enhancements in the Standard BSIM-BULK MOSFET Model A Sharma, YH Zarkob, R Goel, CK Dabhi, G Pahwa, C Hu, YS Chauhan 2022 IEEE International Conference on Emerging Electronics (ICEE), 1-6, 2022 | | 2022 |