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Matt Hiscock
Matt Hiscock
Head of Product Science, Oxford Instruments NanoAnalysis
Verified email at oxinst.com - Homepage
Title
Cited by
Cited by
Year
Characterisation of the filter inlet system on the FAAM BAe-146 research aircraft and its use for size-resolved aerosol composition measurements
A Sanchez-Marroquin, DHP Hedges, M Hiscock, ST Parker, ...
Atmospheric Measurement Techniques 12 (11), 5741-5763, 2019
242019
Grain boundary diffusion of titanium in polycrystalline quartz and its implications for titanium in quartz (TitaniQ) geothermobarometry
GD Bromiley, M Hiscock
Geochimica et Cosmochimica Acta 178, 281-290, 2016
202016
Local thickness and composition analysis of TEM lamellae in the FIB
C Lang, M Hiscock, M Dawson, C Hartfield
Microelectronics Reliability 54 (9-10), 1790-1793, 2014
132014
Advances in the analysis of gunshot residue and other trace evidence using EDS and EBSD in the SEM
F Bauer, M Hiscock, C Lang
Microscopy and Microanalysis 22 (S3), 2046-2047, 2016
102016
New Developments in Automated Particle Analysis in the Electron Microscope-from Micro to Nano
C Lang, M Hiscock, J Holland, S Yamaguchi, D Joyce, G Vatougia
Microscopy and Microanalysis 21 (S3), 337-338, 2015
92015
In-situ quantification of TEM lamella thickness and Ga implantation in the FIB
M Hiscock, M Dawson, C Lang, C Hartfield, P Statham
Microscopy and Microanalysis 20 (S3), 342-343, 2014
82014
Automated SEM analysis in industrial process control and scientific research
C Lang, A Hyde, M Hiscock, S Burgess, J Holland, P Statham
Microscopy and Microanalysis 20 (S3), 1106-1107, 2014
62014
Characterization of Two-Dimensional Transition Metal Dichalcogenides in the Scanning Electron Microscope Using Energy Dispersive X-ray Spectrometry, Electron Backscatter …
C Lang, M Hiscock, K Larsen, J Moffat, R Sundaram
Applied Microscopy 45 (3), 131-134, 2015
52015
Automated analysis of EDS maps
C Lang, M Hiscock
Microscopy and Microanalysis 22 (S3), 122-123, 2016
42016
Improving Sensitivity and Productivity with High count rate X-ray spectrum images
S Burgess, M Hiscock, P Pinard
Microscopy and Microanalysis 23 (S1), 46-47, 2017
32017
Importance of grain boundary diffusion: an experimental study
MJ Hiscock
The University of Edinburgh, 2014
22014
Automated Feature Analysis of Complex Geological Materials
M Hiscock, S Burgess, J Zhang, A Stavropoulou
Microscopy and Microanalysis 25 (S2), 2468-2469, 2019
12019
Data associated with'Characterisation of the filter inlet system on the BAE-146 research aircraft and its use for size resolved aerosol composition measurements'
A Sánchez Marroquín, DHP Hedges, M Hiscock, ST Parker, ...
University of Leeds, 2019
12019
EBIC-Enabled NanoManipulators-Investigating Dislocations in mc-Solar Cells
P Hamer, D Tweddle, T Martin, P Wilshaw, M Hiscock, J Lindsay
Microscopy and Microanalysis 23 (S1), 1426-1427, 2017
12017
Measuring the number of layers in 2D materials with SEM and AFM
C Lang, M Hiscock, R Sundaram, J Moffat, K Larsen
European Microscopy Congress 2016: Proceedings, 441-442, 2016
12016
Enhancing Materials and Device Analysis Capability in the SEM and FIB-SEM by using a Nanomanipulator
M Hiscock, C Lang, P Statham, F Bauer, C Hartfield
Microscopy and Microanalysis 22 (S3), 16-17, 2016
12016
Automated Mineral Liberation Analysis on a Multipurpose SEM
C Lang, M Hiscock, J Liipo, H Otterstroem
矿物学报 1, 2013
12013
Battery Materials: In-Situ Analysis with the Scanning Electron Microscope
A Stavropoulou, L Spasevski, J Lea, U Schmidt, M Hiscock
Electrochemical Society Meeting Abstracts 243, 2874-2874, 2023
2023
Multimodal analysis of concrete and cementitious materials
J Lea, D Haspel, A Blanco-Alvarez, J Kolawole, L Whyte, M Hiscock
Microscopy and Microanalysis 29 (Supplement_1), 2004-2004, 2023
2023
Comprehensive Automated Thin-Section Characterization Combined with Quantitative Major-Trace Element Analysis on a Single SEM
R Jones, M Hiscock, P Trimby, R Gardner, R Mclaughlin, S Burgess
Microscopy and Microanalysis 27 (S1), 1860-1862, 2021
2021
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