Follow
Megha Sharma
Megha Sharma
Delhi Technological University
Verified email at dtu.ac.in
Title
Cited by
Cited by
Year
Design and investigation of recessed-T-gate double channel HEMT with InGaN back barrier for enhanced performance
M Sharma, R Chaujar
Arabian Journal for Science and Engineering, 1-8, 2021
152021
Ultrascaled 10 nm T‐gate E‐mode InAlN/AlN HEMT with polarized doped buffer for high power microwave applications
M Sharma, R Chaujar
International Journal of RF and Microwave Computer‐Aided Engineering 32 (4 …, 2022
122022
Impact of graded back-barrier on linearity of recessed gate inaln/gan hemt
M Sharma, R Chaujar
2020 IEEE VLSI DEVICE CIRCUIT AND SYSTEM (VLSI DCS), 154-158, 2020
112020
Polarization induced doping and high-k passivation engineering on T-gate MOS-HEMT for improved RF/microwave performance
M Sharma, B Kumar, R Chaujar
Materials Science and Engineering: B 290, 116298, 2023
42023
Scattering Parameter Analysis of Gate Stack Gate All Around (GS-GAA) FinFET at THz for RF Applications
B Kumar, M Sharma, R Chaujar
2022 8th International Conference on Signal Processing and Communication …, 2022
22022
Dual-k Spacer JAM-GS-GAA FinFET: A Device for Low Power Analog Applications
B Kumar, M Sharma, R Chaujar
2022 IEEE Silchar Subsection Conference (SILCON), 1-5, 2022
22022
The Performance Analysis of 70nm T-gate InAlN/AlN MOS-HEMT using Graded Buffer
M Sharma, R Chaujar
2021 Devices for Integrated Circuit (DevIC), 466-470, 2021
22021
Linearity analysis of T-gate HEMT with graded back-barrier for wireless applications
M Sharma, B Kumar, R Chaujar
2022 IEEE International Conference on Electronics, Computing and …, 2022
12022
Simulation investigation of double-heterostructure T-gate HEMT with graded back-barrier engineering for improved RF performance
M Sharma, B Kumar, R Chaujar
Materials Today: Proceedings 71, 155-159, 2022
12022
Static Performance Assessment of Junctionless Accumulation Mode Gate Stack Gate All Around (JAM-GS-GAA) FinFET Under Severe Temperature
B Kumar, M Sharma, R Chaujar
2021 7th International Conference on Signal Processing and Communication …, 2021
12021
Effect of Gate Oxide Material Variability on The Analog Performance of T-Gate GaN-MOS-HEMT with Graded Buffer
M Sharma, B Kumar, R Chaujar
2021 7th International Conference on Signal Processing and Communication …, 2021
12021
The system can't perform the operation now. Try again later.
Articles 1–11