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Avashesh Dubey
Avashesh Dubey
Reliability Engineer at Pragmatic Semiconductor
Verified email at ieee.org
Title
Cited by
Cited by
Year
Modeling and simulation of junctionless double gate radiation sensitive FET (RADFET) dosimeter
A Dubey, A Singh, R Narang, M Saxena, M Gupta
IEEE Transactions on Nanotechnology 17 (1), 49-55, 2017
252017
Investigation of total ionizing dose effect on SOI tunnel FET
A Dubey, R Narang, M Saxena, M Gupta
Superlattices and Microstructures 133, 106186, 2019
172019
Investigation of single event transient effects in junctionless accumulation mode MOSFET
A Dubey, R Narang, M Saxena, M Gupta
IEEE Transactions on Device and Materials Reliability 20 (3), 604-608, 2020
112020
Comparative Study of CMOS based Dosimeters for Gamma Radiation
A Dubey, M Gupta, R Narang, M Saxena
2018 4th International Conference on Devices, Circuits and Systems (ICDCS …, 2018
72018
Total ionizing dose effects in junctionless accumulation mode MOSFET
A Dubey, R Narang, M Saxena, M Gupta
Applied Physics A 127, 1-9, 2021
52021
Floating Gate Junction-Less Double Gate Radiation Sensitive Field Effect Transistor (RADFET) Dosimeter: A Simulation Study
A Dubey, R Narang, M Saxena, M Gupta
The Physics of Semiconductor Devices: Proceedings of IWPSD 2017, 571-576, 2019
22019
Investigation of single-event-transient effect in floating-gate junctionless double-gate field-effect-transistor
A Dubey, M Gupta, R Narang, M Saxena
2019 IEEE 14th Nanotechnology Materials and Devices Conference (NMDC), 1-4, 2019
2019
Analytical model of junctionless double gate radiation sensitive FET (RADFET) dosimeter
A Dubey, M Gupta, R Narang, M Saxena
2016 IEEE International Nanoelectronics Conference (INEC), 1-2, 2016
2016
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