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Co-authors
- Xubin HeTemple UniversityVerified email at temple.edu
- Qing LiuAssociate Professor, New Jersey Institute of TechnologyVerified email at njit.edu
- Norbert PodhorszkiScientific Data Group, Oak Ridge National LaboratoryVerified email at ornl.gov
- Scott KlaskyOak Ridge National LaboratoryVerified email at ornl.gov
- Ping HuangAmazon AWSVerified email at amazon.com
- Eric SuchytaOak Ridge National LaboratoryVerified email at ornl.gov
- Jong Youl ChoiOak Ridge National LaboratoryVerified email at ornl.gov
- Matthew WolfSamsung Seminconductor, Inc.Verified email at samsung.com
- Wen XiaHarbin Institute of Technology, ShenzhenVerified email at hit.edu.cn
- Kun TangTemple UniversityVerified email at vcu.edu
- Jinzhen WangBrooklyn College of City University of New YorkVerified email at brooklyn.cuny.edu
- Sheng DiArgonne National Labratory, IEEE Senior MemberVerified email at anl.gov
- Weizhe ZhangProfessor of Peng Cheng Laboratory & Harbin Institute of TechnologyVerified email at hit.edu.cn
- Dingwen TaoIndiana University Bloomington, IEEE/ACM Senior MemberVerified email at iu.edu
- Mark AinsworthProfessor, Division of Applied Mathematics, Brown UniversityVerified email at brown.edu
- David R. PugmireOak Ridge National LaboratoryVerified email at ornl.gov
- Franck CappelloArgonne National Laboratory, IEEE FellowVerified email at anl.gov
- Yuhua GuoElectrical and Computer Engineering, Virginia Commonwealth UniversityVerified email at vcu.edu
- Wenjie LiuTemple UniversityVerified email at temple.edu
- Shakeel AlibhaiComputer Science Student, Temple University