Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants TS Nidhin, A Bhattacharyya, RP Behera, T Jayanthi, K Velusamy Nuclear Engineering and Technology 49 (8), 1589-1599, 2017 | 50 | 2017 |
A review on SEU mitigation techniques for FPGA configuration memory TS Nidhin, A Bhattacharyya, RP Behera, T Jayanthi IETE Technical Review 35 (2), 157-168, 2018 | 25 | 2018 |
Verification of fault tolerant techniques in finite state machines using simulation based fault injection targeted at FPGAs for SEU mitigation TS Nidhin, A Bhattacharyya, RP Behera, T Jayanthi, K Velusamy 2017 4th International Conference on Electronics and Communication Systems …, 2017 | 16 | 2017 |
Dependable system design with soft error mitigation techniques in SRAM based FPGAs TS Nidhin, A Bhattacharyya, RP Behera, T Jayanthi, K Velusamy 2017 Innovations in Power and Advanced Computing Technologies (i-PACT), 1-6, 2017 | 8 | 2017 |
Total Ionizing Dose Effects in GaAs-Si Based Electronic Components TSN R. P. Behera IPACT'17, 0 | 3* | |
Measurement of radiation absorbed dose effects in SRAM-based FPGAs TS Nidhin, A Bhattacharyya, A Gour, RP Behera, T Jayanthi, K Velusamy IETE Journal of Research 68 (5), 3418-3427, 2022 | 2 | 2022 |
SEU mitigation by golay code in the configuration memory of SRAM based FPGAs TS Nidhin, A Bhattacharyya, RP Behera, T Jayanthi, K Velusamy 2016 International Conference on Control, Instrumentation, Communication and …, 2016 | 2 | 2016 |
Artificial Neural Microcircuits for use in Neuromorphic System Design MAT Andrew Walter, Shimeng Wu, Andy Tyrrell, Liam McDaid, Malachy McElholm ... ALIFE 2023: Ghost in the Machine: Proceedings of the 2023 Artificial Life …, 2023 | 1* | 2023 |
Introducing the NAIL Accelerator Interface Layer for Low Latency FPGA Offload G Edward, G Thurstan, W James, V Chris, A Adam, D Jack, E Alexander, ... 2023 International Conference on Field Programmable Technology (ICFPT), 290-291, 2024 | | 2024 |
Study of total ionization dose effects in electronic devices TS Nidhin, A Bhattacharyya, A Gour, RP Behera, T Jayanthi Proceedings of the thirty-third IARP international conference on …, 2018 | | 2018 |
Study of Radiation Effects in SRAM Based FPGAs for NPP IandC System Design TS Nidhin Mumbai, 0 | | |
Irradiation Experiments on SRAM-FPGAs and its Test Setups: An Overview TS Nidhin, A Bhattacharyya, RP Behera, T Jayanthi, K Velusamy CLB 5 (6.5), 108, 0 | | |
Dependable System Design with Soft Error Mitigation Techniques in SRAM-Based FPGAs KV T S Nidhin, Anindya Bhattacharyya, R P Behera, T Jayanthi IPACT'17, 0 | | |