| Effect of O2/Ar gas flow ratio on the optical properties and mechanical stress of sputtered HfO2 thin films S Jena, RB Tokas, JS Misal, KD Rao, DV Udupa, S Thakur, NK Sahoo Thin Solid Films 592, 135-142, 2015 | 63 | 2015 |
| Influence of oxygen partial pressure on microstructure, optical properties, residual stress and laser induced damage threshold of amorphous HfO2 thin films S Jena, RB Tokas, S Tripathi, KD Rao, DV Udupa, S Thakur, NK Sahoo Journal of Alloys and Compounds 771, 373-381, 2019 | 47 | 2019 |
| Tunable mirrors and filters in 1D photonic crystals containing polymers S Jena, RB Tokas, S Thakur, DV Udupa Physica E: Low-dimensional systems and Nanostructures 114, 113627, 2019 | 38 | 2019 |
| Tamm plasmon polariton in planar structures: A brief overview and applications C Kar, S Jena, DV Udupa, KD Rao Optics & Laser Technology 159, 108928, 2023 | 33 | 2023 |
| Study of aging effects on optical properties and residual stress of HfO2 thin film S Jena, RB Tokas, S Thakur, DV Udupa Optik 185, 71-81, 2019 | 27 | 2019 |
| Non-destructive thickness measurement of dichromated gelatin films deposited on glass plates RP Shukla, DV Udupa, NC Das, MV Mantravadi Optics & Laser Technology 38 (7), 552-557, 2006 | 27 | 2006 |
| Study of ZrO2 thin films deposited at glancing angle by radio frequency magnetron sputtering under varying substrate rotation RB Tokas, S Jena, JS Misal, KD Rao, SR Polaki, C Pratap, DV Udupa, ... Thin Solid Films 645, 290-299, 2018 | 24 | 2018 |
| Low cost digital holographic microscope for 3-D cell imaging by integrating smartphone and DVD optical head BK Goud, DD Shinde, DV Udupa, CM Krishna, KD Rao, NK Sahoo Optics and Lasers in Engineering 114, 1-6, 2019 | 21 | 2019 |
| Optical coherence tomography for shape and radius of curvature measurements of deeply curved machined metallic surfaces: a comparison with two-beam laser interferometry KD Rao, DV Udupa, C Prathap, A Rathod, R Balasubramaniam, ... Optics and Lasers in Engineering 66, 204-209, 2015 | 19 | 2015 |
| Evaluation of microstructure and residual stress in W/B4C multilayer optics A Majhi, M Dilliwar, PC Pradhan, S Jena, M Nayak, MN Singh, DV Udupa, ... Journal of Applied Physics 124 (11), 2018 | 18 | 2018 |
| Boron carbide thin films deposited by RF-PECVD and PLD technique: A comparative study based on structure, optical properties, and residual stress A Bute, S Jena, S Kedia, DV Udupa, K Singh, D Bhattacharya, MH Modi, ... Materials Chemistry and Physics 258, 123860, 2021 | 16 | 2021 |
| Thermally tunable terahertz omnidirectional photonic bandgap and defect mode in 1D photonic crystals containing moderately doped semiconductor S Jena, RB Tokas, S Thakur, DV Udupa Physica E: Low-dimensional Systems and Nanostructures 126, 114477, 2021 | 15 | 2021 |
| Zygo interferometer for measuring refractive index of liquids and its application for heavy water analysis RP Shukla, DV Udupa Optics & laser technology 32 (5), 355-360, 2000 | 15 | 2000 |
| Linear and non-linear optical properties of boron carbide thin films A Bute, S Jena, RK Sharma, DV Udupa, N Maiti Applied Surface Science 608, 155101, 2023 | 11 | 2023 |
| Rabi-like splitting and refractive index sensing with hybrid Tamm plasmon-cavity modes S Jena, RB Tokas, S Thakur, DV Udupa Journal of Physics D: Applied Physics 55 (17), 175104, 2022 | 11 | 2022 |
| PRISA: a user-friendly software for determining refractive index, extinction co-efficient, dispersion energy, band gap, and thickness of semiconductor and dielectric thin films S Jena, RB Tokas, S Thakur, DV Udupa Nano Express 2 (1), 010008, 2021 | 9 | 2021 |
| Understanding of stress and its correlation with microstructure near the layer continuous limit in nano-scaled multilayers A Majhi, PC Pradhan, S Jena, MN Singh, M Nayak, SK Rai, DV Udupa Journal of Applied Crystallography 52 (2), 332-343, 2019 | 8 | 2019 |
| Instrumentation and signal processing for the detection of heavy water using off axis–integrated cavity output spectroscopy technique A Gupta, PJ Singh, DY Gaikwad, DV Udupa, A Topkar, NK Sahoo Review of Scientific Instruments 89 (2), 2018 | 8 | 2018 |
| Zygo interferometer for measuring refractive index of photorefractive bismuth silicon oxide (Bi12SiO20) crystal RP Shukla, DV Udupa, MD Aggarwal Optics & Laser Technology 30 (6-7), 425-430, 1998 | 8 | 1998 |
| Simple method for measuring long radius of curvature of metal cylindrical surface RP Shukla, DV Udupa, AK Sinha Journal of Optics 30, 73-83, 2001 | 7 | 2001 |
