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Dr. Ashok M Mahajan
Dr. Ashok M Mahajan
Senior Professor and Head, Department of Electronics, Director, SoPS, KBCNMU, JALGAON
Verified email at nmu.ac.in - Homepage
Title
Cited by
Cited by
Year
Structural and electrical characteristics of RF-sputtered HfO2 high-k based MOS capacitors
PM Tirmali, AG Khairnar, BN Joshi, AM Mahajan
Solid-state electronics 62 (1), 44-47, 2011
892011
Effect of post-deposition annealing temperature on RF-Sputtered HfO< sub> 2</sub> thin film for advanced CMOS technology
AG Khairnar, AM Mahajan
Solid State Sciences 15, 24-28, 2013
802013
Growth and characterization of SiON thin films by using thermal-CVD machine
RK Pandey, LS Patil, JP Bange, DR Patil, AM Mahajan, DS Patil, ...
Optical materials 25 (1), 1-7, 2004
632004
Growth of SiO2 films by TEOS-PECVD system for microelectronics applications
AM Mahajan, LS Patil, JP Bange, DK Gautam
Surface and Coatings Technology 183 (2-3), 295-300, 2004
612004
Sol–gel deposited ceria thin films as gate dielectric for CMOS technology
AG Khairnar, AM Mahajan
Bulletin of Materials Science 36 (2), 259–263., 2013
312013
Electrical properties of MOS capacitors formed by PEALD grown Al2O3 on silicon
AM Mahajan, AG Khairnar, BJ Thibeault
Semiconductors 48, 497-500, 2014
282014
TEOS-PECVD system for high growth rate deposition of SiO2 films
AM Mahajan, LS Patil, JP Bange, DK Gautam
Vacuum 79 (3-4), 194-202, 2005
252005
HfO2 gate dielectric on Ge (1 1 1) with ultrathin nitride interfacial layer formed by rapid thermal NH3 treatment
KS Agrawal, VS Patil, AG Khairnar, AM Mahajan
Applied Surface Science 364, 747-751, 2016
212016
Surface texture modification of spin-coated SiO2 xerogel thin films by TMCS silylation
YS Mhaisagar, BN Joshi, AM Mahajan
Bulletin of Materials Science 35, 151-155, 2012
212012
Structural and electrical properties of ultra-thin high-k ZrO2 film on nitride passivated Ge (100) prepared by PEALD
VS Patil, KS Agrawal, AG Khairnar, BJ Thibeault, AM Mahajan
Materials Science in Semiconductor Processing 56, 277-281, 2016
182016
Ammonia gas sensing characteristics of chemically synthesized polyaniline matrix
RG Bavane, MD Shirsat, AM Mahajan
Sensors & Transducers 113 (2), 63, 2010
182010
High Dielectric Constant ZrO2 Films by Atomic Layer Deposition Technique on Germanium Substrates
AM Mahajan, AG Khairnar, BJ Thibeault
Silicon 8, 345-350, 2016
172016
XPS study of homemade plasma enhanced atomic layer deposited La2O3/ZrO2 bilayer thin films
V Patil, K Agrawal, V Barhate, S Patil, A Mahajan
Semiconductor Science and Technology 34 (3), 034004, 2019
152019
Electronic nose: A toxic gas sensor by polyaniline thin film conducting polymer
AG Shrivas, RG Bavane, AM Mahajan
2007 International Workshop on Physics of Semiconductor Devices, 621-623, 2007
152007
Growth and characterization of porous SiO2 thin films for interlayer dielectrics applications in ULSI
BN Joshi, AM Mahajan
Optoelectronics and Advanced Materials 1 (12), 659-662, 2007
152007
Preparation of rare earth CeO2 thin films using metal organic decomposition method for metal-oxide–semiconductor capacitors
KS Agrawal, VS Patil, AG Khairnar, AM Mahajan
Journal of Materials Science: Materials in Electronics 28, 12503-12508, 2017
122017
Post-deposition-annealed lanthanum-doped cerium oxide thin films: structural and electrical properties
VN Barhate, KS Agrawal, VS Patil, AM Mahajan
Rare Metals 40 (7), 1835-1843, 2021
92021
Deposition characterization of low-k hybrid thin films using methyl methacrylate for ULSI applications
BN Joshi, AM Mahajan
Materials Science and Engineering: B 168 (1-3), 182-185, 2010
92010
Synthesis and characterization of sol-gel derived CeO2 dielectric thin films for CMOS devices
AB Patil, AM Mahajan
Optoelectronics and Advanced Materials, Rapid Communications 2 (12), 811-813, 2008
92008
The effect of post-deposition annealing on the chemical, structural and electrical properties of Al/ZrO2/La2O3/ZrO2/Al high-k nanolaminated MIM capacitors
SR Patil, VN Barhate, VS Patil, KS Agrawal, AM Mahajan
Journal of Materials Science: Materials in Electronics 33 (14), 11227-11235, 2022
82022
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