| Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI N Chauhan, C Garg, K Ni, AK Behera, S Yadav, S Banchhor, N Bagga, ... 2022 IEEE International Reliability Physics Symposium (IRPS), P23-1-P23-6, 2022 | 6 | 2022 |
| Analysis of Nanosheet Field Effect Transistor (NSFET) for device and circuit perspective P Kumar, S Yadav, PK Pal 2019 Women Institute of Technology Conference on Electrical and Computer …, 2019 | 6 | 2019 |
| Impact of Size, Latency of Cache-L1 and Workload Over System Performance R Saha, YP Pundir, S Yadav, PK Pal 2020 International Conference on Advances in Computing, Communication …, 2020 | 3 | 2020 |
| Through-silicon-via induced stress-aware FinFET buffer sizing in 3D ICs S Yadav, N Chauhan, R Chawla, A Sharma, S Banchhor, R Pratap, ... Semiconductor Science and Technology 37 (8), 085023, 2022 | 1 | 2022 |
| A physical insight into variation aware minimum V DD for deep subthreshold operation of FinFET S Yadav, N Chauhan, S Tyagi, A Sharma, S Banchhor, R Joshi, R Pratap, ... Semiconductor Science and Technology 36 (12), 125002, 2021 | 1 | 2021 |
| TSV Induced Stress Model and Its Application in Delay Estimation R Chawla, S Yadav, A Sharma, B Kaur, R Pratap, B Anand 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference …, 2018 | 1 | 2018 |
| Behaviour of FinFET Inverter’s Effective Capacitances in Low-Voltage Domain S Yadav, N Chauhan, A Pandey, R Pratap, A Bulusu 2021 25th International Symposium on VLSI Design and Test (VDAT), 1-5, 2021 | | 2021 |
| SET Detection and Radiation Hardened Pipelined 8-Bit ADC Using 180 Nm Technology M Sharma, PK Pal, S Yadav 2018 2nd International Conference on Trends in Electronics and Informatics …, 2018 | | 2018 |
