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Sayandeep Sanyal
Sayandeep Sanyal
Indian Institute of Technology Kharagpur
Verified email at ieee.org
Title
Cited by
Cited by
Year
A Structured Approach for Rapid Identification of Fault-Sensitive Nets in Analog Circuits
S Sanyal, A Patra, P Dasgupta, M Bhattacharya
2019 IEEE 28th Asian Test Symposium (ATS), 135-1355, 2019
52019
Fault Classification and Coverage of Analog Circuits using DC Operating Point and Frequency Response Analysis
S Sanyal, SPPK Garapati, A Patra, P Dasgupta, M Bhattacharya
Proceedings of the 2019 on Great Lakes Symposium on VLSI, 123-128, 2019
32019
Recurrence in Dense-time AMS Assertions
S Sanyal, AAB da Costa, P Dasgupta
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020
22020
CoveRT: A Coverage Reporting Tool for Analog Mixed-Signal Designs
S Sanyal, A Hazra, P Dasgupta, S Morrison, S Surendran, ...
2020 33rd International Conference on VLSI Design and 2020 19th …, 2020
22020
A Framework for Automated Feature Based Mixed-Signal Equivalence Checking
A Ain, S Sanyal, P Dasgupta
International Symposium on VLSI Design and Test, 779-791, 2017
22017
Transistor-level defect coverage and defect simulation
M Bhattacharya, S SANYAL, A Patra, P Dasgupta
US Patent App. 17/450,899, 2022
2022
The CoveRT Approach for Coverage Management in Analog and Mixed Signal Integrated Circuits
S Sanyal, P Dasgupta, A Hazra, S Das, S Morrison, S Surendran, ...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022
2022
Tracking Coverage Artefacts for Periodic Signals using Sequence-based Abstractions
A Chakraborty, S Sanyal, P Dasgupta, A Hazra, S Morrison, S Surendran, ...
2022 35th International Conference on VLSI Design and 2022 21st …, 2022
2022
CoVerPlan: A Comprehensive Verification Planning Framework leveraging PSS Specifications
S Das, S Sanyal, A Hazra, P Dasgupta
ACM Transactions on Design Automation of Electronic Systems (TODAES), 2022
2022
A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal Circuits
S Sanyal, M Bhattacharya, A Patra, P Dasgupta
Journal of Electronic Testing 36 (6), 719-730, 2020
2020
Fault Vulnerability Ranking of Transistors in Analog Integrated Circuits using AC Analysis
SPPK Garapati, S Sanyal, A Patra, P Dasgupta, M Bhattacharya
2020 IEEE International Test Conference India, 1-8, 2020
2020
The Notion of Cross Coverage in AMS Design Verification
S Sanyal, A Hazra, P Dasgupta, S Morrison, S Surendran, ...
2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 217-222, 2020
2020
A machine learning approach for choosing component level conditions for prognostics of AMS systems
S Sanyal, A Ain, P Dasgupta
2018 International Symposium on Devices, Circuits and Systems (ISDCS), 1-6, 2018
2018
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