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Onur N Demirer
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Cited by
Year
Energetic performance optimization of a capacitive deionization system operating with transient cycles and brackish water
ON Demirer, RM Naylor, CAR Perez, E Wilkes, C Hidrovo
Desalination 314, 130-138, 2013
1062013
Macro Analysis of the Electro-Adsorption Process in Low Concentration NaCl Solutions for Water Desalination Applications
CAR Perez, ON Demirer, RL Clifton, RM Naylor, CH Hidrovo
Journal of The Electrochemical Society 160 (3), E13-E21, 2013
482013
Laser-induced fluorescence visualization of ion transport in a pseudo-porous capacitive deionization microstructure
ON Demirer, CH Hidrovo
Microfluidics and Nanofluidics 16 (1-2), 109-122, 2014
162014
Characterization of Ion Transport and-Sorption in a Carbon Based Porous Electrode for Desalination Purposes
ON Demirer, RL Clifton, CAR Perez, R Naylor, C Hidrovo
Journal of Fluids Engineering 135 (4), 041201, 2013
92013
Method and System for Process Control with Flexible Sampling
O Demirer, R Volkovich, W Pierson, M Wagner, D Klein
US Patent App. 15/184,612, 2016
5*2016
Advanced overlay: sampling and modeling for optimized run-to-run control
L Subramany, WJ Chung, P Samudrala, H Gao, N Aung, JM Gomez, ...
SPIE Advanced Lithography, 97782K-97782K-10, 2016
52016
Systems and Methods for Automated Multi-Zone Detection and Modeling
J Nabeth, ON Demirer, R Karur-Shanmugam, CGH Hoo, C Sparka, H Heo, ...
US Patent App. 15/451,038, 2017
42017
Layer-to-Layer Feedforward Overlay Control with Alignment Corrections
ON Demirer, W Pierson, MD Smith, JS Nabeth, M Garcia-Medina, L Yap
US Patent App. 15/843,371, 2018
32018
CPE run-to-run overlay control for High Volume Manufacturing
L Subramany, WJ Chung, K Gutjhar, M Garcia-Medina, C Sparka, L Yap, ...
Advanced Semiconductor Manufacturing Conference (ASMC), 2015 26th Annual …, 2015
32015
High-volume manufacturing capabilities of run-to-run CPE overlay control
L Subramany, WJ Chung, K Gutjahr, M Garcia-Medina, C Sparka, L Yap, ...
SPIE Advanced Lithography, 94241V-94241V-7, 2015
2*2015
Overlay error investigation for metal containing resist
R Gronheid, S Higashibata, O Demirer, Y Tanaka, D Van Den Heuvel, ...
Journal of Micro/Nanolithography, MEMS, and MOEMS 18 (4), 044001, 2019
12019
Overlay error investigation for metal containing resist (MCR)
R Gronheid, S Higashibata, O Demirer, Y Tanaka, D Van den Heuvel, ...
Metrology, Inspection, and Process Control for Microlithography XXXIII 10959 …, 2019
12019
Determination of Sampling Maps for Alignment Measurements Based on Reduction of Out of Specification Points
BA Riggs, ON Demirer, W Pierson
US Patent App. 15/484,961, 2018
12018
Two different perspectives on capacitive deionization process: performance optimization and flow visualization
ON Demirer
12013
Overlay Variance Stabilization Methods and Systems
H Heo, W Pierson, J Nabeth, S Jeon, ON Demirer, M Garcia-Medina, ...
US Patent App. 15/256,410, 2016
2016
A Thermodynamic Analysis of a Solar Organic Rankine Cycle
J McClintic, DA Kistenmacher, J Anderson, O Demirer, H Berberoglu
ASME 2012 International Mechanical Engineering Congress and Exposition, 223-232, 2012
2012
Macro analysis of the electro adsorption process in a capacitive demonization cell during water desalination at developing and fully developed concentration regimes
C Rios Perez, O Demirer, R Clifton, R Naylor, C Hidrovo
APS Meeting Abstracts 1, 28006, 2012
2012
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Articles 1–17