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Jie Ren
Jie Ren
Verified email at mail.sim.ac.cn
Title
Cited by
Cited by
Year
Progress with physically and logically reversible superconducting digital circuits
J Ren, VK Semenov
IEEE transactions on applied superconductivity 21 (3), 780-786, 2011
1542011
Progress towards reversible computing with nSQUID arrays
J Ren, VK Semenov, YA Polyakov, DV Averin, JS Tsai
IEEE Transactions on Applied Superconductivity 19 (3), 961-967, 2009
552009
Development of multi-layer fabrication process for SFQ large scale integrated digital circuits
L Ying, X Zhang, M Niu, J Ren, W Peng, M Maezawa, Z Wang
IEEE Transactions on Applied Superconductivity 31 (5), 1-4, 2021
452021
RSFQ/ERSFQ cell library with improved circuit optimization, timing verification, and test characterization
A Inamdar, D Amparo, B Sahoo, J Ren, A Sahu
IEEE Transactions on Applied Superconductivity 27 (4), 1-9, 2017
362017
Design and verification of SFQ cell library for superconducting LSI digital circuits
X Gao, Q Qiao, M Wang, M Niu, H Liu, M Maezawa, J Ren, Z Wang
IEEE Transactions on Applied Superconductivity 31 (5), 1-5, 2021
282021
Effects of adaptive DC biasing on operational margins in ERSFQ circuits
C Shawawreh, D Amparo, J Ren, M Miller, MY Kamkar, A Sahu, ...
IEEE Transactions on Applied Superconductivity 27 (4), 1-6, 2017
222017
Design and evaluation of flash ADC
A Inamdar, A Sahu, J Ren, S Setoodeh, R Mansour, D Gupta
IEEE Transactions on Applied Superconductivity 25 (3), 1-5, 2014
212014
Film Stress Influence on Nb/Al-AlOx/Nb Josephson Junctions
Y Wu, L Ying, G Li, X Zhang, W Peng, J Ren, Z Wang
IEEE Transactions on Applied Superconductivity 29 (5), 1-5, 2019
202019
Improved model-to-hardware correlation for superconductor integrated circuits
A Inamdar, J Ren, D Amparo
IEEE Transactions on Applied Superconductivity 25 (3), 1-8, 2014
192014
Process control monitoring for fabrication technology of superconducting integrated circuits
X Zhang, L Ying, M Niu, H Zhang, H Liu, Y Wu, W Xu, L Chen, Y Shao, ...
IEEE Transactions on Applied Superconductivity 31 (5), 1-6, 2021
162021
Miniaturization of the Superconducting Memory Cell via a Three-Dimensional Nb Nano-superconducting Quantum Interference Device
L Chen, L Wu, Y Wang, Y Pan, D Zhang, J Zeng, X Liu, L Ma, W Peng, ...
ACS nano 14 (9), 11002-11008, 2020
162020
Flash ADC comparators and techniques for their evaluation
A Inamdar, A Sahu, J Ren, A Dayalu, D Gupta
IEEE transactions on applied superconductivity 23 (3), 1400308-1400308, 2013
162013
Development of Nb/Al–AlOx/Nb tunnel junction for large-scale integrated digital circuits
W Xiong, L Ying, Y Wu, J Ren, W Peng, Z Wang
IEEE Transactions on Applied Superconductivity 27 (4), 1-4, 2016
152016
All-NbN DC-SQUID magnetometer based on NbN/AlN/NbN josephson junctions
Q Liu, H Wang, Q Zhang, J Ren, W Peng, Z Wang
IEEE Transactions on Applied Superconductivity 27 (4), 1-4, 2016
132016
Research on the bias network of energy-efficient single flux quantum circuits
G Li, J Ren, Y Wu, L Ying, M Niu, L Chen, Z Wang
IEEE Transactions on Applied Superconductivity 29 (5), 1-5, 2019
122019
Low-pass delta-delta-sigma ADC
J Ren, S Sarwana, A Sahu, A Talalaevskii, A Inamdar
IEEE Transactions on Applied Superconductivity 25 (3), 1-6, 2014
112014
Measurement of Specific Capacitance for Nb/Al–AlO /Nb Josephson Junctions in Single-Flux Quantum Circuit Applications
W Xiong, W Xu, Y Wu, G Li, L Ying, W Peng, J Ren, Z Wang
IEEE Transactions on Applied Superconductivity 28 (4), 1-5, 2018
82018
Inductance analysis of superconducting quantum interference devices with 3D nano-bridge junctions
H Wang, R Yang, G Li, L Wu, X Liu, L Chen, J Ren, Z Wang
Superconductor Science and Technology 31 (5), 055015, 2018
72018
Low-power digital gates in ERSFQ and nSQUID technology
M Lucci, J Ren, S Sarwana, I Ottaviani, M Cirillo, D Badoni, G Salina
IEEE Transactions on Applied Superconductivity 26 (3), 1-5, 2016
72016
A hybrid Josephson transmission line and passive transmission line routing framework for single flux quantum logic
S Yang, X Gao, R Yang, J Ren, Z Wang
IEEE Transactions on Applied Superconductivity 32 (9), 1-11, 2022
52022
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