Seungbum Hong
Cited by
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Ferroelectric thin films: Review of materials, properties, and applications
N Setter, D Damjanovic, L Eng, G Fox, S Gevorgian, S Hong, A Kingon, ...
Journal of Applied Physics 100 (5), 051606, 2006
Principle of ferroelectric domain imaging using atomic force microscope
S Hong, J Woo, H Shin, JU Jeon, YE Pak, EL Colla, N Setter, E Kim, K No
Journal of Applied Physics 89 (2), 1377-1386, 2001
Direct observation of region by region suppression of the switchable polarization (fatigue) in Pb (Zr, Ti) O 3 thin film capacitors with Pt electrodes
EL Colla, S Hong, DV Taylor, AK Tagantsev, N Setter, K No
Applied Physics Letters 72 (21), 2763-2765, 1998
Nanoscale Phenomena in Ferroelectric Thin Films
S Hong
High resolution study of domain nucleation and growth during polarization switching in Pb (Zr, Ti) O 3 ferroelectric thin film capacitors
S Hong, EL Colla, E Kim, DV Taylor, AK Tagantsev, P Muralt, K No, ...
Journal of Applied Physics 86 (1), 607-613, 1999
Coexistence of weak ferromagnetism and ferroelectricity in the high pressure LiNbO 3-type phase of FeTiO 3
T Varga, A Kumar, E Vlahos, S Denev, M Park, S Hong, T Sanehira, ...
Physical Review Letters 103 (4), 047601, 2009
Flexible ferroelectric organic crystals
M Owczarek, KA Hujsak, DP Ferris, A Prokofjevs, I Majerz, P Szklarz, ...
Nature Communications 7, 13108, 2016
Origin of surface potential change during ferroelectric switching in epitaxial thin films studied by scanning force microscopy
Y Kim, C Bae, K Ryu, H Ko, YK Kim, S Hong, H Shin
Applied Physics Letters 94 (3), 032907, 2009
Scanning resistive probe microscopy: Imaging ferroelectric domains
H Park, J Jung, DK Min, S Kim, S Hong, H Shin
Applied Physics Letters 84 (10), 1734-1736, 2004
Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy
J Woo, S Hong, N Setter, H Shin, JU Jeon, YE Pak, K No
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2001
Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology
H Shin, S Hong, J Moon, JU Jeon
Ultramicroscopy 91 (1-4), 103-110, 2002
Imaging local polarization in ferroelectric thin films by coherent x-ray Bragg projection ptychography
SO Hruszkewycz, MJ Highland, MV Holt, D Kim, CM Folkman, ...
Physical Review Letters 110 (17), 177601, 2013
Effect of cantilever–sample interaction on piezoelectric force microscopy
S Hong, H Shin, J Woo, K No
Applied Physics Letters 80 (8), 1453-1455, 2002
Screening mechanisms at polar oxide heterointerfaces
S Hong, SM Nakhmanson, DD Fong
Reports on Progress in Physics 79 (7), 076501, 2016
Emerging Non-Volatile Memories
S Hong, O Auciello, D Wouters
Springer, 2014
Unusual size effect on the polarization patterns in micron-size Pb (Zr, Ti) O 3 film capacitors
I Stolichnov, E Colla, A Tagantsev, SSN Bharadwaja, S Hong, N Setter, ...
Applied Physics Letters 80 (25), 4804-4806, 2002
On measurement of optical band gap of chromium oxide films containing both amorphous and crystalline phases
S Hong, E Kim, DW Kim, TH Sung, K No
Journal of Non-crystalline Solids 221 (2-3), 245-254, 1997
Three-dimensional ferroelectric domain imaging of epitaxial thin films using angle-resolved piezoresponse force microscopy
M Park, S Hong, JA Klug, MJ Bedzyk, O Auciello, K No, A Petford-Long
Applied Physics Letters 97 (11), 112907, 2010
Injection charge assisted polarization reversal in ferroelectric thin films
Y Kim, S Bühlmann, S Hong, SH Kim, K No
Applied Physics Letters 90 (7), 072910, 2007
Effects of cantilever buckling on vector piezoresponse force microscopy imaging of ferroelectric domains in nanostructures
R Nath, S Hong, JA Klug, A Imre, MJ Bedzyk, RS Katiyar, O Auciello
Applied Physics Letters 96 (16), 163101, 2010
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