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Chua Kok Yau
Chua Kok Yau
PhD Student
Verified email at student.utem.edu.my
Title
Cited by
Cited by
Year
Microstructural and mechanical analysis of Cu and Au interconnect on various bond pads
TJS Anand, CK Yau, YS Leong, LW Keat, HM Ting
Current applied physics 13 (8), 1674-1683, 2013
172013
Oxidation study on as-bonded intermetallic of copper wire–aluminum bond pad metallization for electronic microchip
TJS Anand, CK Yau, LB Huat
Materials Chemistry and Physics 136 (2-3), 638-647, 2012
132012
Copper wire reliability and bonding integrity robustness on cratering sensitive bond pad structure
LC Chian, NK Chai, LC Chia, CM King, LO Seng, CK Yau
2006 Thirty-First IEEE/CPMT International Electronics Manufacturing …, 2006
112006
Manufacturing a package using plateable encapsulant
SW Chan, CF Chiang, KY Chua, SL Goh, SK Lee, J Mahler, MC Ng, ...
US Patent App. 15/448,018, 2017
102017
Warpage of thin wafers using computer aided reflection moire method
CS Ng, KY Chua, MT Ong, YC Goh, AK Asundi
Advanced Characterization Techniques for Optics, Semiconductors, and …, 2007
72007
XRD analysis of Cu-Al interconnect intermetallic compound in an annealed micro-chip
KY Chua, MT Hng, CC Lee, TJS Anand
Advanced Materials Research 620, 166-172, 2013
52013
Molded package structure with glue bleed stopper for sealing a MEMs device method of packaging a MEMs device
KY Chua, SW Chan, CF Chiang, S Martens, M Steiert, KH Yeo, HS Chua, ...
US Patent 9,475,691, 2016
42016
Semiconductor package with plateable encapsulant and a method for manufacturing the same
SW Chan, CF Chiang, KY Chua, SL Goh, SK Lee, J Mahler, MC Ng, ...
US Patent 10,396,007, 2019
32019
Bond strength evaluation of heat treated Cu-Al wire bonding
S Shariza, TJS Anand, ARM Warikh, LC Chia, CK Yau, LB Huat
Journal of Mechanical Engineering and Sciences 12 (4), 4275-4284, 2018
32018
Effect of impact force towards Cu wire bonding reliability
LC Chia, CK Yau, TS Chee
2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC), 1-5, 2015
32015
Micro-structural studies of thermosonic Cu-Al bonding interface
TJS Anand, C Kok Yau, A Jalar
Advanced Materials Research 925, 154-158, 2014
32014
Statistical analysis on the mechanical and micro-structural characteristics of thermosonic CuAl interconnection
CK Yau, TJS Anand, S Shariza, YF Khong, LC Chia, LB Huat, R Singh, ...
Microelectronics Reliability 109, 113664, 2020
22020
Micro-electrical mechanical system sensor package and method of manufacture thereof
CF Chiang, KY Chua
US Patent 10,631,100, 2020
22020
System and method for over under sensor packaging
SW Chan, CF Chiang, KY Chua, SK Lee, CY Ng
US Patent App. 15/653,234, 2019
22019
Manufacturing a package using plateable encapsulant
SW Chan, CF Chiang, KY Chua, SL Goh, SK Lee, J Mahler, MC Ng, ...
US Patent 11,081,417, 2021
12021
Device having substrate with conductive pillars
CF Chiang, KY Chua, SK Lee, CY Ng, V Solomko
US Patent 10,163,812, 2018
12018
Modelling of wire bonding Cu-Al intermetallic formation growth towards interfacial stress
LC Chia, CK Yau, TJS Anand, S Shariza, MRB Jamli
2017 IEEE 19th Electronics Packaging Technology Conference (EPTC), 1-5, 2017
12017
Voltage regulator module with inductor-cooled power stage
G Deboy, KY Chua, A Kessler, KK Leong, CY Ng, L Peluso
US Patent App. 17/742,442, 2023
2023
Method for Fabricating an Electrical Device Package Comprising Plateable Encapsulating Layers
KY Chua, PAA Calo, CH Lee
US Patent App. 17/741,597, 2022
2022
Method for connecting an electrical device to a bottom unit by using a solderless joint
CF Chiang, PAA Calo, CL Cha, KY Chua, CH Lee, SK Lee, TC Long, ...
US Patent App. 17/677,055, 2022
2022
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