| Detection of cancer antigens (CA-125) using gold nano particles on interdigitated electrode-based microfluidic biosensor BB Nunna, D Mandal, JU Lee, H Singh, S Zhuang, D Misra, MNU Bhuyian, ... Nano convergence 6, 1-12, 2019 | 70 | 2019 |
| Controlling Color Emission of InGaN/AlGaN Nanowire Light-Emitting Diodes Grown by Molecular Beam Epitaxy HPTN M. R. Philip, D. D. Choudhary, M.Djavid, M. N. Bhuyian, J. Piao, T. T ... Journal of Vacuum Science & Technology B 35 (2), 02B108-1-5, 2017 | 32 | 2017 |
| Cyclic Plasma Treatment during ALD Hf1-xZrxO2 Deposition MN Bhuyian, D Misra, K Tapily, RD Clark, S Consiglio, CS Wajda, ... ECS Journal of Solid State Science and Technology 3 (5), N83, 2014 | 24 | 2014 |
| Impact of cyclic plasma treatment on oxygen vacancy defects in TiN/HfZrO/SiON/Si gate stacks MNU Bhuyian, S Poddar, D Misra, K Tapily, RD Clark, S Consiglio, ... Applied Physics Letters 106 (19), 2015 | 22 | 2015 |
| Multilayered ALD HfAlOx and HfO2 for High Quality Gate Stacks MNU Bhuyian, D Misra IEEE Transactions on Device and Materials Reliability 15 (2), 229-235, 2015 | 21 | 2015 |
| Fabrication of Phosphor-Free III-Nitride Nanowire Light-Emitting Diodes on Metal Substrates for Flexible Photonics MR Philip, DD Chowdhury, M Djavid, MN Bhuyian, THQ Bui, D Misra, ... ACS Omega 2 (9), 5708–5714, 2017 | 19 | 2017 |
| Reliability of ALD Hf1-XZrxO2 Deposited By Intermediate Annealing Or Intermediate Plasma Treatment MNU Bhuyian, D Misra, K Tapily, R Clark, S Consiglio, C Wajda, ... ECS Transactions 58 (7), 17-29, 2013 | 11 | 2013 |
| Oxygen vacancy defect engineering using atomic layer deposited HfAlOx in multi-layered gate stack MN Bhuyian, R Sengupta, P Vurikiti, D Misra Applied Physics Letters 108 (18), 183501-05, 2016 | 7 | 2016 |
| Electrical characterization of dry and wet processed interface layer in Ge/High-K devices YM Ding, D Misra, MN Bhuyian, K Tapily, RD Clark, S Consiglio, ... Journal of Vacuum Science & Technology B 34 (2), 2016 | 7 | 2016 |
| Phosphor-free III-nitride nanowire white-light-emitting diodes for visible light communication MR Philip, THQ Bui, M Djavid, MN Bhuyian, P Vu, HPT Nguyen Proc. SPIE, Active and Passive Smart Structures and Integrated Systems XII …, 2018 | 4 | 2018 |
| ALD Hf0.2Zr0.8O2 and HfO2 with Cyclic Annealing/SPA Plasma Treatment: Reliability MN Bhuyian, D Misra Emerging Materials Research 4 (August), 358-389, 2015 | 4* | 2015 |
| Post Plasma Oxidation Processed ALD Al2O3/Hf1-xZrxO2 Thin Films on Ge Substrates: Reliability MN Bhuyian, P Shao, A Sengupta, Y Ding, D Misra, K Tapily, RD Clark, ... ECS Journal of Solid State Science and Technology 7 (2), N1, 2018 | 2 | 2018 |
| Interface state density engineering in Hf1-xZrxO2/SiON/Si gate stack MNU Bhuyian, D Misra, K Tapily, RD Clark, S Consiglio, CS Wajda, ... Journal of Vacuum Science & Technology B 34 (1), 2016 | 2 | 2016 |
| Electrical characterization of dry and wet processed interface layer in Ge/high-k devices YIM Ding, D Misra, M Bhuyian, K Tapily, RD Clark, S Consiglio, CS Wajda, ... ECS Transactions 69 (5), 313, 2015 | 2 | 2015 |
| Breakdown Characteristics of TiN/HfxZr1-xO2/Al2O3/Ge Gate Stacks P Shao, MNU Bhuyian, Y Ding, D Misra ECS Transactions 80 (1), 71, 2017 | 1 | 2017 |
| High-k Dielectrics and Device Reliability MN Bhuyian Nano-CMOS and Post-CMOS Electronics: Devices and Modelling, 1-34, 2016 | 1 | 2016 |
| Emerging high-k dielectrics for nanometer CMOS technologies and memory devices DD Misra, MNU Bhuyian, YM Ding, KL Ganapathi, N Bhat Advanced Technologies for Next Generation Integrated Circuits, 159-196, 2020 | | 2020 |
| Frequency and Area Dependence of High-K/Ge MOS Capacitors I Mitevski, D Misra, MN Bhuyian, Y Ding ECS Transactions 77 (11), 1977, 2017 | | 2017 |
| Reliability of Post Plasma Oxidation Processed ALD Al2O3/Hf1-xZrxO2 Thin Films on Ge Substrates MNU Bhuyian, A Sengupta, Y Ding, D Misra, K Tapily, RD Clark, ... ECS Transactions 77 (2), 99-108, 2017 | | 2017 |
| Dielectric-semiconductor interface for high-k gate dielectrics for sub-16nm CMOS technology D Misra, MN Bhuyian, Y Ding 2015 IEEE International Conference on Electron Devices and Solid-State …, 2015 | | 2015 |
Robert D. ClarkTokyo ElectronVerified email at us.tel.com
