| ESD reliability study of a-Si: H thin-film transistor technology: Physical insights and technological implications R Sinha, P Bhattacharya, IET Iben, S Sambandan, M Shrivastava IEEE Transactions on Electron Devices 66 (6), 2624-2630, 2019 | 14 | 2019 |
| Adaptive Dielectric Thin Film Transistors-A Self-Configuring Device for Low Power Electrostatic Discharge Protection P Bhattacharya, R Sinha, BK Thakur, V Parab, M Shrivastava, ... IEEE Electron Device Letters 41 (1), 66-69, 2019 | 5 | 2019 |
| Nano-second timescale high-field phase transition in hydrogenated amorphous silicon R Sinha, P Bhattacharya, S Sambandan, M Shrivastava Journal of Applied Physics, 2019 | 3 | 2019 |
| On the ESD behavior of a-Si: H based thin film transistors: Physical insights, design and technological implications R Sinha, P Bhattacharya, S Sambandan, M Shrivastava 2018 IEEE International Reliability Physics Symposium (IRPS), 3E. 2-1-3E. 2-6, 2018 | 3 | 2018 |
| On the ESD behavior of pentacene channel organic thin film transistors R Sinha, NK Kranthi, S Sambandan, M Shrivastava 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 1-6, 2017 | 3 | 2017 |
| Nano-second timescale drain voltage induced electrical instabilities in hydrogenated amorphous silicon thin film transistors R Sinha, P Bhattacharya, S Sambandan, M Shrivastava Japanese Journal of Applied Physics 59 (7), 074004, 2020 | 2 | 2020 |
| Threshold voltage shift in a-Si: H thin film transistors under ESD stress conditions R Sinha, P Bhattacharya, S Sambandan, M Shrivastava 2020 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2020 | 1 | 2020 |
| On the ESD behavior of a-Si: H based diode-connected thin-film transistors R Sinha, S Sambandan, M Shrivastava 2022 IEEE International Conference on Emerging Electronics (ICEE), 1-5, 2022 | | 2022 |
| On the ESD behavior of hydrogenated amorphous silicon based high-voltage TFTs R Sinha, S Sambandan, M Shrivastava 2022 IEEE International Conference on Emerging Electronics (ICEE), 1-5, 2022 | | 2022 |
| Reliability Physics of Thin-Film Transistors R Sinha | | 2022 |
| Utilisation of Agriculture Credit KC Sharma, RR Sinha, RS Reddy | | 2016 |
Mayank ShrivastavaIndian Institute of Science BangaloreVerified email at iisc.ac.in
