| Non-invasive precision metrology using diffraction phase microscopy and space-frequency method S Ajithaprasad, R Gannavarpu Optics and Lasers in Engineering 109, 17-22, 2018 | 31 | 2018 |
| Defect detection using windowed Fourier spectrum analysis in diffraction phase microscopy S Ajithaprasad, R Velpula, R Gannavarpu Journal of Physics Communications 3 (2), 025006, 2019 | 24 | 2019 |
| Fast and robust method for flow analysis using GPU assisted diffractive optical element based background oriented schlieren (BOS) J Ramaiah, S Ajithaprasad, R Gannavarpu, D Ambrosini Optics and Lasers in Engineering 126, 105908, 2020 | 17 | 2020 |
| Automated defect identification from carrier fringe patterns using Wigner–Ville distribution and a machine learning-based method A Vishnoi, A Madipadaga, S Ajithaprasad, R Gannavarpu Applied Optics 60 (15), 4391-4397, 2021 | 14 | 2021 |
| Step phase reconstruction using an anisotropic total variation regularization method in a diffraction phase microscopy AVS Vithin, S Ajithaprasad, G Rajshekhar Applied optics 58 (26), 7189-7194, 2019 | 13 | 2019 |
| Dynamic noncontact surface profilometry using a fast eigenspace method in diffraction phase microscopy S Ajithaprasad, J Ramaiah, R Gannavarpu Applied Optics 59 (19), 5796-5802, 2020 | 12 | 2020 |
| Wigner–Ville distribution based diffraction phase microscopy for non-destructive testing A Vishnoi, A Sreeprasad, G Rajshekhar Journal of Modern Optics 66 (16), 1644-1651, 2019 | 10 | 2019 |
| Fringe pattern normalization algorithm using Kalman filter S Sharma, R Kulkarni, S Ajithaprasad, R Gannavarpu Results in Optics 5, 100152, 2021 | 9 | 2021 |
| Graphics processing unit assisted diffraction phase microscopy for fast non-destructive metrology J Ramaiah, S Ajithaprasad, G Rajshekhar Measurement Science and Technology 30 (12), 125202, 2019 | 9 | 2019 |
| Subspace analysis based machine learning method for automated defect detection from fringe patterns D Pandey, J Ramaiah, S Ajithaprasad, R Gannavarpu Optik 270, 170026, 2022 | 7 | 2022 |
| Demodulating interferograms with non-uniform amplitude variations for precision non-contact optical profilometry AVS Vithin, I Show, S Ajithaprasad, R Gannavarpu Optics and Lasers in Engineering 134, 106292, 2020 | 6 | 2020 |
| Demodulation of fringe patterns corrupted by non uniform intensity variations in dynamics studies AVS Vithin, I Show, S Ajithaprasad, G Rajshekhar Optical Metrology and Inspection for Industrial Applications VII 11552, 367-374, 2020 | | 2020 |
| Dynamic deformation analysis using diffraction phase microscopy and space-frequency analysis S Ajithaprasad, J Ramaiah, R Gannavarpu 2019 Workshop on Recent Advances in Photonics (WRAP), 1-3, 2019 | | 2019 |
| A GPU assisted space frequency method for dynamic defect detection in optical metrology S Ajithaprasad, V Rajendran, R Gannavarpu Seventh International Conference on Optical and Photonic Engineering (icOPEN …, 2019 | | 2019 |
| Laser assisted defect detection using diffraction phase microscopy and space frequency analysis GR Sreeprasad Ajithaprasad National Photonics Symposium, International school of photonics, Cochin, India, 2019 | | 2019 |
| Nanoscale non-destructive measurement of surface profile using diffraction phase microscopy and windowed Fourier transform GR Sreeprasad Ajithaprasad Photonics 2018, IIT Delhi, 2018 | | 2018 |
Gannavarpu RajshekharAssociate Professor, Indian Institute of Technology KanpurVerified email at iitk.ac.in
